LDGM2643 data sheet ligitek electronics co.,ltd. property of ligitek only round t ype led lamps doc. no : qw0905-LDGM2643 rev. : a date : 17 - may - 2005
note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation ligitek electronics co.,ltd. property of ligitek only package dimensions part no. LDGM2643 page 1/4 0 x 25% 75% 100% 50% -30 x -60 x 75% 25% 0 50% 30 x 100% 60 x 25.0min 3.1 2.9 0.5 typ 2.54typ 1.0min 1.5max 4.3 3.3
3.5 typ. v 150 esd electrostatic discharge color water clear typical electrical & optical characteristics (ta=25 j ) note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. ingan/gan material LDGM2643 part no green emitted operating temperature storage temperature soldering temperature dominant wave length f dnm luminous intensity @20ma(mcd) viewing angle 2 c 1/2 (deg) forward voltage @20ma(v) spectral halfwidth ??f nm 525 lens 36 4.0 max. 550 1100 min. typ. 28 -30 ~ +100 max 260 j for 5 sec max (2mm from body) tsol tstg t opr -20 ~ +80 j j absolute maximum ratings at ta=25 j part no. LDGM2643 forward current peak forward current duty 1/10@10khz reverse current @5v power dissipation parameter page 2/4 pd ir i fp i f 120 50 100 30 symbol ratings dgm ma ma g a mw unit ligitek electronics co.,ltd. property of ligitek only peak wave length f pnm 518
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0101001000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 450 550 600 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 500 dgm chip 3/4 page part no. LDGM2643
the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this test is the resistance of the device under tropical for hous. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to see soldering well performed or not. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. solder resistance test solderability test thermal shock test high temperature high humidity test 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 reliability test: part no. LDGM2643 ligitek electronics co.,ltd. property of ligitek only the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. test condition 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test operating life test test item description page 4/4 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard
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